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Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer

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China ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd. certification
China ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd. certification
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Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer

Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer
Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer

Large Image :  Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer

Product Details:
Place of Origin: China
Brand Name: Crystro
Certification: SGS
Model Number: CRLAO-4
Payment & Shipping Terms:
Minimum Order Quantity: 1
Price: Negotiable
Packaging Details: Transparent clean box
Delivery Time: 3-4 weeks
Payment Terms: T/T, Western Union, MoneyGram,paypal
Supply Ability: 100 pcs per week
Detailed Product Description
Name: Lanthanum Aluminate Crystal Growth Method: Czochralski
Crystal Orientation: <100> <110> <111> Thickness: 0.5mm /1.0 Mm
Diameter: 3 Inches / 76mm Polishing: Single Or Double
Density: 6.52 (g/cm 3) Hardness: 6-6.5(mohs)
Melting Point (℃): 2080℃ Thermal Expansion: 9.4x10-6/℃
Highlight:

3 Inch LaAlO3 Wafer

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Lanthanum Aluminate LaAlO3 Wafer

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Lanthanum Aluminate Wafer


 

 

Diameter 3 Inches LaAlO3 ( Lanthanum Aluminate) Wafer High TC Thin Flim Substrates

 

1.Introduction :

LaAIO3 is a high temperature superconducting single crystal substrate. It is an excellent substrate for epitaxial growth of high Tc superconductors, magnetic and ferroelectric thin films. The dielectric properties of LaAlO3 crystal are well suitable for low loss microwave and dielectric resonance applications. Crystro can offer 3 inches (76mm) in diameter and larger single crystals.

 

2.Main Advantages :

  • Small dielectric constant;
  • wide energy gap;
  • large specific surface area;
  • certain activity;
  • good thermal stability
  • low dielectric loss;
  • good lattice matching;
  • small thermal expansion coefficient;
  • good chemical stability;

 

 

3.Material Properties :

Crystal Structure Cubic
Growth Method

Czochralski method

Density

6.52(g/cm3)

Melt Point 2080℃
Hardness 6.5 Mohs

Thermal expansion

9.2 × 10^-6

Dielectric constants

24

Secant loss(10ghz)

~ 3 × 10 -4 @ 300k, ~ 0.6 × 10 -4 @ 77k

Color and appearance

Transparent to brown based on annealing condition

 

 

 

 

 

 

 

 

 

 

 

 

4.Crystro offers :

Size  Max Φ 76.2mm (3''inches)
Thickness 0.5mm /1.0 mm
Polishing Single or Double
Crystal Orientation

<100> <110> <111>

Redirection precision

±0.5°

Redirection the edge

2°(special in 1°)

Angle of crystalline

Special size and orientation are available upon request

Ra

≤5Å(5µm×5µm)

Pack

Class100 clean bag,Class 1000 clean bag

 

 

 

 

 

 

 

 

 

 

 

Diameter 3 Inches Lanthanum Aluminate LaAlO3 Wafer 0

Contact Details
ANHUI CRYSTRO CRYSTAL MATERIALS Co., Ltd.

Contact Person: Zheng

Tel: +86 18255496761

Fax: 86-551-63840588

Send your inquiry directly to us (0 / 3000)